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On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment
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On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment
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Date
2008-02
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16320.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Govoreanu, Bogdan
;
Van Houdt, Jan
Journal
IEEE Electron Device Letters
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Acq. date: 2025-12-16
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Views
1806
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-16
Citations