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On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment

Date

2008-02
Journal article
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dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-17T07:23:14Z
dc.date.available2021-10-17T07:23:14Z
dc.date.embargo9999-12-31
dc.date.issued2008-02
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13802
dc.source.beginpage177
dc.source.endpage179
dc.source.issue2
dc.source.journalIEEE Electron Device Letters
dc.source.volume29
dc.title

On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment

dc.typeJournal article
dspace.entity.typePublication
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