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Electric field-induced carrier accumulation at the vanadium dioxide - dielectric interface
Publication:
Electric field-induced carrier accumulation at the vanadium dioxide - dielectric interface
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martens, Koen
;
Jeong, Jaewoo
;
Phani, Aetukuri
;
Esfahani, Davoud
;
Peeters, Francois
;
Moshchalkov, Victor
;
Van de Vondel, Joris
;
Charles, Rettner
;
Douhard, Bastien
;
Vandervorst, Wilfried
;
Mahesh, Samant
;
Parkin, Stuart
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Abstract
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1859
since deposited on 2021-10-22
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item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1859
since deposited on 2021-10-22
405
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations