Publication:

Electric field-induced carrier accumulation at the vanadium dioxide - dielectric interface

Date

2014
Meeting abstract
Simple item page Full metadata Statistics
 
dc.contributor.authorMartens, Koen
dc.contributor.authorJeong, Jaewoo
dc.contributor.authorPhani, Aetukuri
dc.contributor.authorEsfahani, Davoud
dc.contributor.authorPeeters, Francois
dc.contributor.authorMoshchalkov, Victor
dc.contributor.authorVan de Vondel, Joris
dc.contributor.authorCharles, Rettner
dc.contributor.authorDouhard, Bastien
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorMahesh, Samant
dc.contributor.authorParkin, Stuart
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorDouhard, Bastien
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.date.accessioned2021-10-22T03:33:56Z
dc.date.available2021-10-22T03:33:56Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24215
dc.identifier.urlhttp://meetings.aps.org/Meeting/MAR14/Session/M47.3
dc.source.beginpageM47.4
dc.source.conferenceAPS March Meeting
dc.source.conferencedate3/03/2014
dc.source.conferencelocationDenver, CO USA
dc.title

Electric field-induced carrier accumulation at the vanadium dioxide - dielectric interface

dc.typeMeeting abstract
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions