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Characterization of threading dislocations in thin germanium layers by defect etching: towards chromium and HF free solution
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Characterization of threading dislocations in thin germanium layers by defect etching: towards chromium and HF free solution
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Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Souriau, Laurent
;
Atanasova, Tanya
;
Terzieva, Valentina
;
Moussa, Alain
;
Caymax, Matty
;
Loo, Roger
;
Meuris, Marc
;
Vandervorst, Wilfried
Journal
Journal of the Electrochemical Society
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Views
1929
since deposited on 2021-10-17
2
last month
Acq. date: 2025-12-15
Citations