Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Publication:
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Copy permalink
Date
2021
Proceedings Paper
https://doi.org/10.23919/DATE51398.2021.9473999
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
DATE21_Characterization_and_Fault_Modeling_of_Intermediate_State_in_STT-MRAMs_final-version.pdf
628.29 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Lizhou
;
Rao, Siddharth
;
Taouil, Mottaqiallah
;
Marinissen, Erik Jan
;
Kar, Gouri Sankar
;
Hamdioui, Said
Journal
na
Abstract
Description
Metrics
Views
1612
since deposited on 2022-07-18
Acq. date: 2025-12-12
Citations
Metrics
Views
1612
since deposited on 2022-07-18
Acq. date: 2025-12-12
Citations