Publication:
Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms
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1948 since deposited on 2021-09-29
1last month
Acq. date: 2025-12-15
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Metrics
Views
1948 since deposited on 2021-09-29
1last month
Acq. date: 2025-12-15
Citations