Publication:
Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms
Date
| dc.contributor.author | Wellekens, Dirk | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | Faraone, Lorenzo | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.imecauthor | Wellekens, Dirk | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-09-29T13:25:52Z | |
| dc.date.available | 2021-09-29T13:25:52Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1015 | |
| dc.source.beginpage | 1992 | |
| dc.source.endpage | 1998 | |
| dc.source.issue | 11 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 42 | |
| dc.title | Write/erase degradation in source side injection flash EEPROMs: characterization techniques and wearout mechanisms | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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