Publication:
SOI n- and pMuGFET devices with different TiN metal gate tThickness under influence of sidewall crystal orientation
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1885 since deposited on 2021-10-19
3last month
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Acq. date: 2026-08-08
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Statistics
Views
1885 since deposited on 2021-10-19
3last month
1last week
Acq. date: 2026-08-08
Citations