Publication:
IGZO Schottky diode as a material characterization tool: DLTS and noise measurements
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
2003 since deposited on 2021-10-21
2last month
1last week
Acq. date: 2026-04-05
Citations
Statistics
Views
2003 since deposited on 2021-10-21
2last month
1last week
Acq. date: 2026-04-05
Citations