Publication:

IGZO Schottky diode as a material characterization tool: DLTS and noise measurements

Date

2013
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dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorSimoen, Eddy
dc.contributor.authorBhoolokam, Ajay
dc.contributor.authorNag, Manoj
dc.contributor.authorGenoe, Jan
dc.contributor.authorGielen, Georges
dc.contributor.authorHeremans, Paul
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorNag, Manoj
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.date.accessioned2021-10-21T13:08:41Z
dc.date.available2021-10-21T13:08:41Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23218
dc.source.conferenceMRS Fall Meeting Symposium R: Oxide Semiconductors
dc.source.conferencedate1/12/2013
dc.source.conferencelocationBoston, MA USA
dc.title

IGZO Schottky diode as a material characterization tool: DLTS and noise measurements

dc.typeOral presentation
dspace.entity.typePublication
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