Publication:

Layer-controlled, wafer-scale fabrication of 2D semiconductor materials

Date

2018

Meeting abstract

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Author(s)

Chiappe, Daniele

;

Afanasiev, Valeri

;

;

;

Leonhardt, Alessandra

;

Ludwig, Jonathan

;

Celano, Umberto

;

;

;

Pourtois, Geoffrey

;

;

;

Huyghebaert, Cedric

;

Asselberghs, Inge

;

De Gendt, Stefan

;

Metrics

1977 since deposited on 2021-10-25

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Acq. date: 2025-12-16