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Exploration of a low-temperature PEALD technology to trim and smooth 193i photoresist
Publication:
Exploration of a low-temperature PEALD technology to trim and smooth 193i photoresist
Date
2017
Proceedings Paper
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37299.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lazzarino, Frederic
;
Paolillo, Sara
;
Peter, Antony
;
De Roest, David
;
Seong, TaeGeun
;
Wu, Yizhi
;
Decoster, Stefan
;
Rutigliani, Vito
;
Lorusso, Gian
;
Constantoudis, Vassilios
;
Van Elshocht, Sven
;
Piumi, Daniele
;
Barla, Kathy
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2012
since deposited on 2021-10-24
Acq. date: 2025-10-24
Citations
Metrics
Views
2012
since deposited on 2021-10-24
Acq. date: 2025-10-24
Citations