Publication:
In-depth low frequency noise evaluation of substrate rotation and strain engineering in n-type triple gate SOI FinFETs
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1854 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-10
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Metrics
Views
1854 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-10
Citations