Publication:
In-depth low frequency noise evaluation of substrate rotation and strain engineering in n-type triple gate SOI FinFETs
Date
| dc.contributor.author | Trevisoli, R. | |
| dc.contributor.author | de Souza, M. | |
| dc.contributor.author | Martino, J.A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Pavanello, M.A. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T23:39:07Z | |
| dc.date.available | 2021-10-22T23:39:07Z | |
| dc.date.issued | 2015 | |
| dc.identifier.issn | 0167-9317 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26006 | |
| dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0167931715002683 | |
| dc.source.beginpage | 92 | |
| dc.source.endpage | 95 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 147 | |
| dc.title | In-depth low frequency noise evaluation of substrate rotation and strain engineering in n-type triple gate SOI FinFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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