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Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study
Publication:
Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study
Date
2014
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Minari, Hideki
;
Yoshida, Shinichi
;
Sawada, Ken
;
Nakazawa, Masashi
;
Pourtois, Geoffrey
;
Merckling, Clement
;
Waldron, Niamh
;
Guo, Weiming
;
Jiang, Sijia
;
Collaert, Nadine
;
Simoen, Eddy
;
Lin, Dennis
;
Caymax, Matty
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1972
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1972
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations