Publication:

Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study

Date

2014
Proceedings Paper
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dc.contributor.authorMinari, Hideki
dc.contributor.authorYoshida, Shinichi
dc.contributor.authorSawada, Ken
dc.contributor.authorNakazawa, Masashi
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorMerckling, Clement
dc.contributor.authorWaldron, Niamh
dc.contributor.authorGuo, Weiming
dc.contributor.authorJiang, Sijia
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorLin, Dennis
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-22T03:49:26Z
dc.date.available2021-10-22T03:49:26Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24255
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6861166&openedRefinements%3D*%26filter%3DAND(NOT(4283010803))%26p
dc.source.beginpagePI.2
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.title

Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study

dc.typeProceedings paper
dspace.entity.typePublication
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