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Articles
Potential vulnerability of dynamic CMOS logic to soft gate oxide breakdown
Publication:
Potential vulnerability of dynamic CMOS logic to soft gate oxide breakdown
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Groeseneken, Guido
Journal
IEEE Electron Devices Letters
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1829
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Acq. date: 2025-12-16
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Views
1829
since deposited on 2021-10-15
4
last month
Acq. date: 2025-12-16
Citations