Publication:
Potential vulnerability of dynamic CMOS logic to soft gate oxide breakdown
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-15T05:06:26Z | |
| dc.date.available | 2021-10-15T05:06:26Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7717 | |
| dc.source.beginpage | 742 | |
| dc.source.endpage | 744 | |
| dc.source.issue | 12 | |
| dc.source.journal | IEEE Electron Devices Letters | |
| dc.source.volume | 24 | |
| dc.title | Potential vulnerability of dynamic CMOS logic to soft gate oxide breakdown | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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