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Can Electro-Mechanical Stress Enable Effective Majority Logic Implementations?

 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
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cris.virtual.orcid0000-0002-8604-8368
cris.virtual.orcid0000-0002-7088-2075
cris.virtual.orcid0000-0002-4831-3159
cris.virtualsource.department4eda70b4-271f-4025-a6cf-711de8c283f2
cris.virtualsource.departmentc71c617d-4de5-4a2a-a4f8-019b5a992cb3
cris.virtualsource.department3e839b18-b9e5-46f9-95d4-760837031f7a
cris.virtualsource.orcid4eda70b4-271f-4025-a6cf-711de8c283f2
cris.virtualsource.orcidc71c617d-4de5-4a2a-a4f8-019b5a992cb3
cris.virtualsource.orcid3e839b18-b9e5-46f9-95d4-760837031f7a
dc.contributor.authorVan Zegbroeck, A.
dc.contributor.authorVan Meirvenne, Emma
dc.contributor.authorAnagnostou, P.
dc.contributor.authorCiubotaru, Florin
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorHamdioui, S.
dc.contributor.authorCotofana, S.
dc.date.accessioned2026-06-04T15:02:58Z
dc.date.available2026-06-04T15:02:58Z
dc.date.createdwos2026-03-06
dc.date.issued2026
dc.description.abstractTheoretically speaking, Majority logic, originally proposed in the ′70s, enables more compact and efficient arithmetic implementations than the conventional Boolean counterpart. Nonetheless, CMOS technology based Majority logic realizations remain challenging, as standard transistor-based approaches are unable to directly exhibit majority behavior. However, recent exploration on beyond CMOS technologies created a resurgence of the interest in majority logic. In this work, we propose and analyze a novel approach towards the 3-input Majority gate (MAJ3) implementation by means of piezoelectric materials. By leveraging their intrinsic electromechanical properties, we convert the digital input signals into mechanical deformations, which are accumulated in a transfer layer. Subsequently, we transform the combined deformation back to the electric domain with a piezoelectronics element properly designed to perform majority functionality. We first present the underlying principles behind our proposal with a short introduction on majority logic, piezoelectronics, and the utilized simulation framework. Afterwards we introduce the proposed piezoelectric 3-input Majority gate (piezo-MAJ3) and strategies for optimizing its behavior and performance. We also detail the material parameters and structural design impact on device performance by utilizing both analytical discussion and physics-based simulations. Finally, we shortly highlight how our proposal can be directly integrated into CMOS circuits and compare the piezo-MAJ3 potential cost and performance with the ones of state of the art implementations. Our results indicate that when compared with its CMOS counterpart, the piezo-MAJ3 gate requires half the area, it is 7x faster, while reducing with 44% the energy consumption.
dc.description.wosFundingTextThis work was supported in part by the IMEC industrial affiliate program on Beyond CMOS Logic and in part by the Horizon Europe research and innovationprogram within the Project SPIDER under Contract 101070417
dc.identifier.doi10.1109/ojnano.2026.3661648
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59594
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage34
dc.source.endpage40
dc.source.journalIEEE OPEN JOURNAL OF NANOTECHNOLOGY
dc.source.numberofpages7
dc.source.volume7
dc.subject.keywordsTRANSISTOR
dc.title

Can Electro-Mechanical Stress Enable Effective Majority Logic Implementations?

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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