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Characterization of epitaxial Pb(Zr,Ti)O3 thin films deposited by pulsed laser deposition on silicon cantilevers

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dc.contributor.authorNguyen, M.D.
dc.contributor.authorNazeer, H.
dc.contributor.authorKarakaya, Koray
dc.contributor.authorPham, S.V.
dc.contributor.authorSteenwelle, R.
dc.contributor.authorDekkers, M.
dc.contributor.authorAbelmann, L.
dc.contributor.authorBlank, M.
dc.contributor.authorRijnders, G.
dc.date.accessioned2021-10-18T19:33:30Z
dc.date.available2021-10-18T19:33:30Z
dc.date.issued2010
dc.identifier.issn0960-1317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17692
dc.source.beginpage85022
dc.source.issue8
dc.source.journalJournal of Micromechanics and Microengineering
dc.source.volume20
dc.title

Characterization of epitaxial Pb(Zr,Ti)O3 thin films deposited by pulsed laser deposition on silicon cantilevers

dc.typeJournal article
dspace.entity.typePublication
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