Publication:

Electrical and structural properties of oxygen-precipitation induced extended defects in silicon

Date

Loading...
Thumbnail Image

Journal

Abstract

Description

Statistics

Views

1825 since deposited on 2021-09-30
1last month
Acq. date: 2026-05-16

Citations

Statistics

Views

1825 since deposited on 2021-09-30
1last month
Acq. date: 2026-05-16

Citations