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Conference contributions
Minimizing plasma damage of CVD low-k materials by tuning a two step etch sequence.
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Minimizing plasma damage of CVD low-k materials by tuning a two step etch sequence.
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Aelst, Joke
;
Baklanov, Mikhaïl
;
Le, Quoc Toan
;
Struyf, Herbert
;
Boullart, Werner
;
Vanhaelemeersch, Serge
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1911
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-17
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1911
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-17
Citations