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Comparison of an L-array and a single transistor method to extract Leff and Rs in deep submicron MOSFETs
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Comparison of an L-array and a single transistor method to extract Leff and Rs in deep submicron MOSFETs
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Date
1997
Proceedings Paper
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1708.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Biesemans, Serge
;
De Meyer, Kristin
Journal
Abstract
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1802
since deposited on 2021-09-30
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Acq. date: 2025-12-15
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Metrics
Views
1802
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-15
Citations