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Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class Memory
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Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class Memory
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Date
2017-09
Dissertation
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43201.pdf
20.96 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Michael
Journal
Abstract
Description
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1944
since deposited on 2021-10-24
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Acq. date: 2025-12-16
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Metrics
Views
1944
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-16
Citations