Publication:

Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class Memory

Date

2017-09
Dissertation
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dc.contributor.authorChen, Michael
dc.contributor.thesisadvisorGroeseneken, Guido
dc.date.accessioned2021-10-24T03:25:16Z
dc.date.available2021-10-24T03:25:16Z
dc.date.embargo9999-12-31
dc.date.issued2017-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28013
dc.identifier.urlhttps://limo.libis.be/primo-explore/fulldisplay?docid=LIRIAS1733271&context=L&vid=Lirias&search_scope=Lirias&tab=default_tab&lang=en_US&fromSitemap=1
dc.title

Understanding and Improving Reliability of Oxide-based Resistive RAM for Embedded Application and Storage Class Memory

dc.typePHD thesis
dspace.entity.typePublication
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