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Correlation between haze of the wafer and particle-count on wafers: a new approach to monitor nano-sized particles
Publication:
Correlation between haze of the wafer and particle-count on wafers: a new approach to monitor nano-sized particles
Date
2002
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Kaidong
;
Vos, Rita
;
Vereecke, Guy
;
Lux, Marcel
;
Fyen, Wim
;
Holsteyns, Frank
;
Kenis, Karine
;
Mertens, Paul
;
Heyns, Marc
;
Vinckier, Chris
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2061
since deposited on 2021-10-15
Acq. date: 2025-10-22
Citations
Metrics
Views
2061
since deposited on 2021-10-15
Acq. date: 2025-10-22
Citations