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Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis
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Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis
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Date
2017
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Franquet, Alexis
;
Spampinato, Valentina
;
Op de Beeck, Jonathan
;
Celano, Umberto
;
Vandervorst, Wilfried
;
Moeler, Rudolf
;
Labyedh, Nouha
;
Vereecken, Philippe
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1927
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Acq. date: 2025-12-15
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Views
1927
since deposited on 2021-10-24
3
last month
Acq. date: 2025-12-15
Citations