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Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence
Publication:
Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tallarico, Andrea
;
Magnone, Paolo
;
Stoffels, Steve
;
Lenci, Silvia
;
Hu, Jie
;
Marcon, Denis
;
Sangiorgi, Enrico
;
Decoutere, Stefaan
;
Fiegna, Claudio
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Abstract
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1952
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations
Metrics
Views
1952
since deposited on 2021-10-23
Acq. date: 2025-10-24
Citations