Publication:

Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence

Date

2016
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorTallarico, Andrea
dc.contributor.authorMagnone, Paolo
dc.contributor.authorStoffels, Steve
dc.contributor.authorLenci, Silvia
dc.contributor.authorHu, Jie
dc.contributor.authorMarcon, Denis
dc.contributor.authorSangiorgi, Enrico
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorFiegna, Claudio
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorLenci, Silvia
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-23T15:26:15Z
dc.date.available2021-10-23T15:26:15Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27377
dc.source.beginpage4A.5
dc.source.conferenceIEEE International Reliability Physics Symposium
dc.source.conferencedate17/04/2016
dc.source.conferencelocationPasadena, CA USA
dc.title

Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
33941.pdf
Size:
337.18 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions