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Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements
Publication:
Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements
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Date
2024
Journal article
https://doi.org/10.1088/1361-6528/ad3744
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kim, Hyeon-Su
;
Peric, Nemanja
;
Minj, Albert
;
Wouters, Lennaert
;
Serron, Jill
;
Mancini, Chiara
;
Koylan, Serkan
;
Sergeant, Stefanie
;
Hantschel, Thomas
Journal
NANOTECHNOLOGY
Abstract
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since deposited on 2024-04-15
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Downloads
124
since deposited on 2024-04-15
52
last month
6
last week
Acq. date: 2025-12-15
Views
116
since deposited on 2024-04-15
4
last month
Acq. date: 2025-12-15
Citations