Publication:
TCAD strain calibration versus nanobeam diffraction of source/drain stressors for Ge MOSFETs
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1872 since deposited on 2021-10-22
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Acq. date: 2026-01-26
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Statistics
Views
1872 since deposited on 2021-10-22
2last month
1last week
Acq. date: 2026-01-26
Citations