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Oxidation behavior of Ni thin films: application to NiO-based ReRAM
Publication:
Oxidation behavior of Ni thin films: application to NiO-based ReRAM
Date
2009
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lisoni, Judit
;
Goux, Ludovic
;
Verleysen, Eveline
;
Wang, Xin Peng
;
Jurczak, Gosia
;
Wouters, Dirk
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1911
since deposited on 2021-10-18
4
last month
Acq. date: 2025-12-08
Citations
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Views
1911
since deposited on 2021-10-18
4
last month
Acq. date: 2025-12-08
Citations