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The black silicon method. VIII. A study of the performance of etching silicon using Sf6/O-2-based chemistry with cryogenical wafer cooling and a high density ICP Source
Publication:
The black silicon method. VIII. A study of the performance of etching silicon using Sf6/O-2-based chemistry with cryogenical wafer cooling and a high density ICP Source
Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jansen, Henri
;
De Boer, M.
;
Wensink, H.
;
Kloeck, B.
;
Elwenspoek, M.
Journal
Microelectronics Journal
Abstract
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1925
since deposited on 2021-10-14
446
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1925
since deposited on 2021-10-14
446
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations