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GaN power IC design using the MIT virtual source GaNFET compact model with gate leakage and V-T instability effect
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1974 since deposited on 2022-02-25
4last month
Acq. date: 2025-12-12
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1974 since deposited on 2022-02-25
4last month
Acq. date: 2025-12-12
Citations