Publication:
GaN power IC design using the MIT virtual source GaNFET compact model with gate leakage and V-T instability effect
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1984 since deposited on 2022-02-25
7last month
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Acq. date: 2026-08-06
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Statistics
Views
1984 since deposited on 2022-02-25
7last month
1last week
Acq. date: 2026-08-06
Citations