Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices
Publication:
Endurance of ferroelectric La-doped HfO2 for SFS gate-stack memory devices
Date
2020
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ronchi, Nicolo
;
McMitchell, Sean
;
Min, Jinhong
;
Banerjee, Kaustuv
;
Van den Bosch, Geert
;
Shin, Changhwan
;
Van Houdt, Jan
Journal
Abstract
Description
Metrics
Views
1877
since deposited on 2021-10-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1877
since deposited on 2021-10-29
Acq. date: 2025-10-23
Citations