Publication:

Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.

Date

2022
Meeting abstract
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Accepted version 712.21 KB

Author(s)

Eyben, Pierre  
;
Arutchelvan, Goutham  
;
Chiarella, Thomas  
;
Arimura, Hiroaki  
;
Ritzenthaler, Romain  
;
Mitard, Jerome  
;
Dentoni Litta, Eugenio  
;
Horiguchi, Naoto  
;
Goux, Ludovic  

Journal

N/A

Abstract

Description

Statistics

Views

952 since deposited on 2022-08-10
4last month
4last week
Acq. date: 2026-07-17

Citations

Statistics

Views

952 since deposited on 2022-08-10
4last month
4last week
Acq. date: 2026-07-17

Citations