Publication:

Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.

Date

2022-09

Meeting abstract

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Files

Accepted version 712.21 KB

Author(s)

;

Arutchelvan, Goutham

;

Chiarella, Thomas

;

Arimura, Hiroaki

;

Ritzenthaler, Romain

;

;

Dentoni Litta, Eugenio

;

Horiguchi, Naoto

;

Journal

N/A

Metrics

943 since deposited on 2022-08-10

Acq. date: 2025-12-16