Publication:

Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.

Date

2022-09
Meeting abstract
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dc.contributor.authorEyben, Pierre
dc.contributor.authorArutchelvan, Goutham
dc.contributor.authorChiarella, Thomas
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorMitard, Jerome
dc.contributor.authorDentoni Litta, Eugenio
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorGoux, Ludovic
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorArutchelvan, Goutham
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorDentoni Litta, Eugenio
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecEyben, Pierre::0000-0003-3686-556X
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecDentoni Litta, Eugenio::0000-0003-0333-376X
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecArimura, Hiroaki::0000-0002-3138-708X
dc.date.accessioned2024-01-18T09:29:24Z
dc.date.available2022-08-10T10:31:41Z
dc.date.available2024-01-18T09:29:24Z
dc.date.embargo9999-12-31
dc.date.issued2022-09
dc.identifier.issnN/A
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40240
dc.source.conferenceSolid State Devices and Materials - SSDM 2022
dc.source.conferencedate26/09/2022
dc.source.conferencelocationChiba - Japan
dc.source.journalN/A
dc.source.numberofpages2
dc.title

Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.

dc.typeMeeting abstract
dspace.entity.typePublication
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