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Mobility degradation influence on the SOI MOSFET channel length extraction at 77 K
Publication:
Mobility degradation influence on the SOI MOSFET channel length extraction at 77 K
Date
1996
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nicolett, A. S.
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal de Physique IV. Colloque 3
Abstract
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1959
since deposited on 2021-09-29
5
last month
4
last week
Acq. date: 2025-12-08
Citations
Metrics
Views
1959
since deposited on 2021-09-29
5
last month
4
last week
Acq. date: 2025-12-08
Citations