Publication:
Characterization of defect states in Mg-doped GaN-on-Si p+n diodes using Deep-Level Transient Fourier Spectroscopy
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1951 since deposited on 2021-10-28
1last month
Acq. date: 2026-01-09
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Metrics
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1951 since deposited on 2021-10-28
1last month
Acq. date: 2026-01-09
Citations