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Impact of top-surface tunnel-oxide nitridation on flash memory performance and reliability
Publication:
Impact of top-surface tunnel-oxide nitridation on flash memory performance and reliability
Date
2010
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ganguly, Udayan
;
Guarini, Theresa
;
Wellekens, Dirk
;
Date, Lucien
;
Cho, Yonah
;
Rothschild, Aude
;
Swenberg, Johanes
Journal
IEEE Electron Device Letters
Abstract
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1878
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Metrics
Views
1878
since deposited on 2021-10-18
416
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations