Publication:

First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping

Date

2014

Proceedings Paper

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Author(s)

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Yoshida, Shinichi

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Nakazawa, Masashi

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Merckling, Clement

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Collaert, Nadine

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Pourtois, Geoffrey

Metrics

1928 since deposited on 2021-10-22

Acq. date: 2025-12-10