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Conference contributions
EUV single exposure Tip-to-Tip variability control through PEB process optimization in BEOL layers
Publication:
EUV single exposure Tip-to-Tip variability control through PEB process optimization in BEOL layers
Date
2023
Proceedings Paper
https://doi.org/10.1117/12.2687558
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Roy, Syamashree
;
Caron, Elke
;
Santos, Andreia
;
Franke, Joern-Holger
;
Vandereyken, Jelle
;
Halder, Sandip
Journal
Proceedings of SPIE
Abstract
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919
since deposited on 2024-01-13
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Acq. date: 2025-10-25
Citations
Metrics
Views
919
since deposited on 2024-01-13
431
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations