Publication:
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
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2115 since deposited on 2021-10-22
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Acq. date: 2026-02-24
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Views
2115 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-02-24
Citations