Publication:
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
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2110 since deposited on 2021-10-22
3last month
Acq. date: 2025-12-10
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Metrics
Views
2110 since deposited on 2021-10-22
3last month
Acq. date: 2025-12-10
Citations