Publication:
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
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2113 since deposited on 2021-10-22
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Acq. date: 2026-01-07
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Views
2113 since deposited on 2021-10-22
3last month
3last week
Acq. date: 2026-01-07
Citations