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Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation
Publication:
Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation
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Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vaisman Chasin, Adrian
;
Franco, Jacopo
;
Bury, Erik
;
Ritzenthaler, Romain
;
Dentoni Litta, Eugenio
;
Spessot, Alessio
;
Horiguchi, Naoto
;
Linten, Dimitri
;
Kaczer, Ben
Journal
na
Abstract
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1780
since deposited on 2021-11-02
1
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1780
since deposited on 2021-11-02
1
last month
Acq. date: 2025-12-16
Citations