Publication:
Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation
Date
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Ritzenthaler, Romain | |
| dc.contributor.author | Dentoni Litta, Eugenio | |
| dc.contributor.author | Spessot, Alessio | |
| dc.contributor.author | Horiguchi, Naoto | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Chasin, Adrian | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Ritzenthaler, Romain | |
| dc.contributor.imecauthor | Litta, Eugenio | |
| dc.contributor.imecauthor | Spessot, Alessio | |
| dc.contributor.imecauthor | Horiguchi, Naoto | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Ben Kaczer | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Dentoni Litta, Eugenio | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Ritzenthaler, Romain::0000-0002-8615-3272 | |
| dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.contributor.orcidimec | Dentoni Litta, Eugenio::0000-0003-0333-376X | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2022-01-20T11:28:13Z | |
| dc.date.available | 2021-11-02T16:05:23Z | |
| dc.date.available | 2022-01-20T11:22:36Z | |
| dc.date.available | 2022-01-20T11:28:13Z | |
| dc.date.issued | 2020 | |
| dc.identifier.eisbn | 978-1-7281-3199-3 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38209 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | APR 28-MAY 30, 2020 | |
| dc.source.conferencelocation | Dallas, TX, USA | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.subject.keywords | RELIABILITY | |
| dc.title | Relevance of fin dimensions and high-pressure anneals on hot-carrier degradation | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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