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On the impact of mechanical stress on gate oxide trapping
Publication:
On the impact of mechanical stress on gate oxide trapping
Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goes, W.
;
Grasser, T.
;
Kruv, Anastasiia
;
Kaczer, Ben
;
Grill, Alexander
;
Gonzalez, Mario
;
Franco, Jacopo
;
Linten, Dimitri
;
De Wolf, Ingrid
Journal
na
Abstract
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Views
1928
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations
Metrics
Views
1928
since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations