Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Evaluation of barrier integrity on ultra low-k films with different porosities
Publication:
Evaluation of barrier integrity on ultra low-k films with different porosities
Date
2013
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wang, Cong
;
Van Besien, Els
;
Baklanov, Mikhaïl
;
Verdonck, Patrick
Journal
Abstract
Description
Metrics
Views
1856
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations
Metrics
Views
1856
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations