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Articles
Equivalent circuit fitting method for microwave characterisation of low-k dielectric thin films
Publication:
Equivalent circuit fitting method for microwave characterisation of low-k dielectric thin films
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Date
2024
Journal article
https://doi.org/10.1088/1361-6501/ad6342
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Guerenneur, Anais
;
Kouznetsov, Dmitry
;
Narducci, Daniele
;
Luciano, Federica
;
Sun, Xiao
;
Van Dorpe, Pol
;
Ciubotaru, Florin
;
Adelmann, Christoph
Journal
MEASUREMENT SCIENCE AND TECHNOLOGY
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560
since deposited on 2024-08-08
Acq. date: 2025-12-16
Citations
Metrics
Views
560
since deposited on 2024-08-08
Acq. date: 2025-12-16
Citations