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A yield-aware modeling methodology for nano-scaled SRAM designs
Publication:
A yield-aware modeling methodology for nano-scaled SRAM designs
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Grossar, Evelyn
;
Croon, Jeroen
;
Stucchi, Michele
;
Dehaene, Wim
;
Maex, Karen
Journal
Abstract
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1887
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1887
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations